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HAST high-pressure accelerated aging chamber
HAST (Highly Accelerated Stress Test) chamber, also known as HAST chamber in English, is used to evaluate the environmental resistance of electronic components, PCBs, chips, etc., under high temperature, high humidity, and high pressure conditions. By accelerating the failure process, the acceleration factor is between tens and hundreds of times. This type of extreme accelerated simulation reliability test helps determine the limit operating conditions of products or devices, making it easier to discover product failure modes in advance and shorten the life test time of products or systems, thus saving time for mass production verification.
Category:
PCT accelerated aging test chamber
Keyword:
Kexun
Mobile:18688631772 18925806499
Product Introduction
Product Specifications: Available in standard capacities from 31L to 248L, with custom options available.
Product Introduction: The HAST (Highly Accelerated Stress Test) chamber is used to evaluate the environmental resistance of electronic components, PCBs, chips, etc., under high temperature, high humidity, and high pressure conditions. It accelerates the failure process by a factor of tens to hundreds of times. This extreme accelerated simulation reliability test helps determine the limit working conditions of products or devices, facilitates the early detection of failure modes, shortens the life test time of products or systems, and saves time for mass production verification.
Product Alias: Highly Accelerated Life Test Machine, HAST High-Pressure Accelerated Life Aging Chamber, HAST Aging Chamber, Unsaturated High-Pressure Accelerated Aging Chamber, UHAST...
The HAST high-pressure accelerated aging chamber, also known as a high-accelerated life aging test chamber, is used for high-pressure, high-temperature, unsaturated/saturated humid heat accelerated life reliability tests on IC packaging, semiconductors, microelectronic chips, magnetic materials, and other electronic components.
► Integrates high-temperature, high-humidity 85℃/85%R.H, 95℃/95%R.H, PCT, and HAST functions.
► Extra-long test run time; the equipment can run continuously for 400+ hours.
► Equipped with bias terminals (conductive screw M6: voltage 0～380V; maximum withstand voltage 2000V; current 0～100A).
► Quick exhaust mode, exhausts cold air before the test; cold air exhaust design during the test (exhausting air inside the test barrel) improves pressure stability and reproducibility. Features
► Compatible with high-accelerated temperature and humidity stress HAST tests and high-pressure steam PCT moisture resistance tests. Compatible with high-accelerated temperature and humidity stress HAST tests and high-pressure steam PCT moisture resistance tests.
Commonly Used HAST Test Standards:
|
Standard Number |
Implementation Standard |
Test Conditions |
|||
|
Temperature (°C) |
Humidity (%R.h) |
Voltage (V) |
Time (h) |
||
|
IEC60068-2-66 |
Environmental testing. Part 2-66: Test methods. Test Cx: Steady-state damp heat |
110±2 |
85±5 |
Any voltage |
96/192/408 |
|
GB/T2423.40 |
Environmental tests for electrotechnical products Part 2: Test methods Cx: Constant damp heat in unsaturated high-pressure steam |
110±2 |
85±5 |
1~1000V |
96/192/408 |
|
GB/T4937.40 |
Semiconductor devices—Mechanical and climatic test methods—Part 4: Damp heat, steady-state, highly accelerated stress test (HAST) |
110±2 |
85±5 |
1~1000V |
96/264 |
|
JIS C0096-2001 |
Environmental testing Part 2: Tilting · Damp heat · Steady-state (unsaturated pressurized steam) |
110±2 |
85±5 |
Any voltage |
96/192/408 |
|
JEITA（EIAJ）ED-4701/100A/103 |
Semiconductor device unsaturated steam pressure test |
110±2 |
85±5 |
Continuous voltage application |
24/48/96/168/500 |
|
JPCA-ET08 |
Printed circuit board unsaturated steam pressure test |
110±2 |
85±5 |
Continuous voltage application |
96/192/408 |
|
AEC Q100-Rev-E |
Automotive grade semiconductor discrete device stress test certification |
110±2 |
85±5 |
Continuous/no bias voltage application |
264/96 |
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JESD22-A101C |
Steady-state temperature, humidity/bias, life test (temperature, humidity, bias life) |
85±2 |
85±5 |
Continuous/intermittent voltage application |
24/168/1000 |
|
JESD22-A102E |
High-pressure steam test (accelerated moisture resistance penetration) |
121±2 |
100±5 |
No bias |
24/48/96/168/240/336 |
|
JESD22-A110E |
HAST highly accelerated temperature and humidity stress test |
110±2 |
85±5 |
Continuous/intermittent voltage application |
264/96 |
|
JESD22-A118B |
Temperature and humidity no-bias high-acceleration stress test UHAST (no bias voltage unsaturated high-pressure steam) |
110±2 |
85±5 |
No bias |
264/96 |
*Customizable specifications and non-standard models
|
HAST High-Pressure Accelerated Aging Chamber |
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Model |
KS-2HAST-31L-A/B |
KS-2HAST-69L-A/B |
KS-2HAST-154L-A/B |
KS-2HAST-248L-A/B |
|
|
Capacity (L) |
31 L |
69 L |
154 L |
248 L |
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Internal Dimensions |
Diameter φ |
350 |
400 |
550 |
650 |
|
Depth D |
450 |
550 |
650 |
750 |
|
|
External Dimensions |
Width W |
700 |
700 |
850 |
950 |
|
Depth D |
1000 |
1000 |
1150 |
1350 |
|
|
Height H |
1710 |
1710 |
1760 |
1860 |
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|
Performance Indicators |
Temperature Range |
A: +100～+143℃; |
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|
Humidity Range |
60%~100%RH |
||||
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Pressure Range |
A: 0.2~3kg/cm² (0.018~0.294Mpa); |
||||
|
Temperature Uniformity |
≤±2℃ |
||||
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Temperature Fluctuation |
≤±0.5℃ |
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Humidity Fluctuation |
≤±2 % R.H |
||||
|
Humidity Deviation |
≤±3 % R.H |
||||
|
Temperature Deviation |
≤±2℃ |
||||
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Pressure Deviation |
≤±2Kpa |
||||
|
Heating-up Time |
Room temperature～+ 143℃ approximately 45 min; Room temperature～+ 156℃ approximately 55 min |
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|
Pressurization Time |
Normal pressure～3kg/cm² approximately 35 min, external gas source pressurization: approximately 5 min |
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Power |
2.8KW |
3.2KW |
4KW |
5KW |
|
|
Cabinet Material |
Inner Chamber |
SUS #316 Stainless Steel |
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Outer Chamber |
Cold-rolled steel plate + double-sided electrostatic spraying process |
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Insulation |
Ultra-fine glass wool |
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Noise |
≤60（dB） |
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Controller |
7-inch color touch screen controller (with pressure, temperature and humidity display, RS-485 or RS-232 communication, USB data baking) |
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Resolution |
Temperature: 0.01℃; Humidity: 0.1%RH; Pressure: 0.1 kg/cm²; |
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Pressurization Method |
1. Boiler steam pressurization; 2. External gas pressurization |
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BIAS Bias Terminal |
Including bias terminal (conductive screw M6: voltage 0～380V; maximum withstand voltage 2000V; current 0～100A) (Please specify when ordering optional) |
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Operating Conditions |
Ambient temperature: +5℃~+35℃; Ambient humidity: ≤85%RH; Ambient atmospheric pressure requirement: 86KPa～106KPa |
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|
Power Supply |
AC220V 50/60Hz |
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Protection Devices |
1. Overtemperature protection, 2. Fan overload protection, 3. Chamber door pressure protection, 4. Water shortage protection, 5. Overflow protection, 6. Heater dry-burn protection, |
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|
Model Description |
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Research, design and production of environmental testing machines
Contact Us
Address: No. 1, Building 1, Zhenrong Road, Wusha, Chang'an Town, Dongguan City, Guangdong Province
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