PCT accelerated aging test chamber-Product Center-Kexun

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dgkesion@163.com
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No. 1, Building 1, Zhenrong Road, Wusha, Chang'an Town, Dongguan City, Guangdong Province

Two-slot HAST high-pressure accelerated aging chamber

The English name for the two-zone HAST high-pressure accelerated aging chamber (2-Zone HAST CHAMBER) is used to evaluate the reliability of products or materials in humid environments. This is accomplished by setting and creating various conditions of temperature, humidity, and pressure within a highly controlled pressure vessel to evaluate product sealing, moisture absorption, and aging performance.

HAST high-pressure accelerated aging chamber

HAST (Highly Accelerated Stress Test) chamber, also known as HAST chamber in English, is used to evaluate the environmental resistance of electronic components, PCBs, chips, etc., under high temperature, high humidity, and high pressure conditions. By accelerating the failure process, the acceleration factor is between tens and hundreds of times. This type of extreme accelerated simulation reliability test helps determine the limit operating conditions of products or devices, making it easier to discover product failure modes in advance and shorten the life test time of products or systems, thus saving time for mass production verification.

HAST high-pressure accelerated aging test chamber (automatic door)

The HAST (Highly Accelerated Stress Test) high-pressure accelerated aging test chamber (with automatic door) simulates the extreme environments and high-temperature, high-humidity operating conditions that a chip may encounter during actual use to verify its reliability and lifespan. Its principle is to place the chip in a high-temperature, high-humidity environment for accelerated aging testing over a period of time, thereby improving product quality and reliability.

PCT high-pressure accelerated aging box

The PCT high-pressure accelerated aging chamber, also known as the saturated steam high-pressure life test chamber, is called High Pressure Cooking Testing Chamber in English. It is used to evaluate the ability of electronic components, PCBs, chips, etc. to resist the environment under high temperature, high humidity, and high pressure conditions. By accelerating the failure process, it shortens the life test time of products or systems and helps to discover product failure modes in advance.

PCT (saturated) high-pressure steam cooking aging box

Used for moisture resistance assessment and robustness testing, aiming to evaluate the moisture resistance of non-hermetic packaged solid-state components under compressed and saturated moisture environments. Under high pressure and high humidity conditions, accelerate moisture penetration (plastic packaging material, chip passivation layer) or design changes (chip, electrode size) and penetration between the interface of the metal conductive layer, thereby identifying the failure mechanism inside the package.

HAST high-pressure accelerated life aging test chamber

HAST Chamber, also known as HAST High-Pressure Accelerated Life Test Chamber, is used for automotive-grade chips, IC packaging, semiconductors, microelectronic chips, magnetic materials, and other electronic components to conduct high-pressure, high-temperature, unsaturated/saturated humid heat, and other accelerated life reliability tests. It is used in the product design stage to quickly expose product defects and weaknesses, and to test the sealing and aging performance of the product.

BHAST (Bias-Temperature Stress Test) Accelerated Aging Test Chamber

To evaluate the operational reliability of non-hermetic packaged IC devices (solid-state devices) under high temperature and high humidity conditions, and to perform high-accelerated stress life aging tests on chips, semiconductors, and other components with temperature, humidity, and bias voltage.

HAST high-pressure accelerated life aging chamber (double-layer type)

The HAST high-pressure accelerated life aging chamber is used to evaluate the environmental resistance of electronic components, PCBs, chips, etc., under high temperature, high humidity, and high pressure conditions. By accelerating the failure process, the acceleration factor is between tens and hundreds of times. This type of extreme accelerated simulation reliability test facilitates the determination of the limit operating conditions of products or devices, making it easier to discover product failure modes in advance and shortening the life test time of products or systems, thus saving time for mass production verification.

Standard high-pressure accelerated aging test chamber

The HAST high-pressure accelerated aging test chamber can perform extreme accelerated tests, used to test the high-temperature and high-humidity resistance of products or materials under specified temperature (above 100°C), humidity (65% to 100%), and pressure conditions. The HAST test chamber can perform combined tests of saturated HAST tests and unsaturated HAST tests.

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Research, design and production of environmental testing machines

Tel: Mr. Wang: +86-18688631772
+86-189-2580-6499

Email: dgkesion@163.com

Address: No. 1, Building 1, Zhenrong Road, Wusha, Chang'an Town, Dongguan City, Guangdong Province

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