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HAST high-pressure accelerated aging test chamber (automatic door)

The HAST (Highly Accelerated Stress Test) high-pressure accelerated aging test chamber (with automatic door) simulates the extreme environments and high-temperature, high-humidity operating conditions that a chip may encounter during actual use to verify its reliability and lifespan. Its principle is to place the chip in a high-temperature, high-humidity environment for accelerated aging testing over a period of time, thereby improving product quality and reliability.

Category:

PCT accelerated aging test chamber

Keyword:

Kexun



Product Introduction

Product Introduction: The HAST (Highly Accelerated Stress Test) high-pressure accelerated aging test chamber (with automatic door) simulates the extreme environments and high-temperature, high-humidity operating conditions that chips may encounter in actual use to test the reliability and lifespan of the chips. Its principle is to place the chips in a high-temperature, high-humidity environment for accelerated aging testing over a period of time, thereby improving product quality and reliability.

Product Alias: Automatic door HAST high-pressure accelerated aging test chamber, automatic door HAST aging test chamber, HAST high-accelerated life test chamber, automatic door HAST

Kexun HAST high-pressure accelerated aging test chamber: English name Highly Accelerated Stress Test Chamber. It simulates the high-temperature, high-humidity, high-pressure environment of chips, conducting accelerated aging tests over a certain period to verify the reliability and lifespan of chips in the shortest time, thereby improving product quality and reliability.

► Industry-first pressure test range up to 4KG,

► Automatic door design, button control for door opening and closing, with built-in pressure protection,

► Built-in self-developed PID control algorithm to ensure the accuracy of temperature, humidity, and pressure values,

► Compatible with constant wet heat (HAST) and pressure cooker test (PCT) using unsaturated high-pressure steam,

Common HAST Test Standards

Standard Number

Implementation Standard

Temperature (°C)

Humidity (%R.h)

Test Conditions
Voltage (V

Time (h)

IEC60068-2-66
C60749

Environmental testing Part 2-66: Test methods Cx: Steady-state temperature and humidity

110±2
120±2
130±2

85±S
85±S
85±S

Any voltage

96/192/408
48/96/192
24/48/96

GB/T2423.40

Environmental testing of electrotechnical products Part 2: Test methods Cx: Constant wet heat with unsaturated high-pressure steam

110±2
120±2
130±2

85±S
85±S
85±S

1-1000V

96/192/408
4896/192
24/48/96

GB/T4937.40

Semiconductor devices—Mechanical and climatic test methods—Part 4: Damp heat, steady-state, highly accelerated stress test (HAST)
(HAST)

110±2
130±2

85±S
85±S

1-1000V

96/264

JIS C0096-2001

Environmental testing Part 2: Damp heat—Steady-state (unsaturated pressurized steam)

110±2
120±2
130±2

85±S
85±S
85±S

Any voltage

96/192/408
48/96/192
24/48/96

JEITA(EIAJ)ED-
4701/100A/103

Semiconductor device unsaturated steam pressure test

110±2
120±2
130±2

85±S
85±S
85±S

Continuous voltage application

24/48/96/168/500

JPCA-ETO8

Printed circuit board unsaturated steam pressure test

110±2
120±2
130±2

85±S
85±S
85±S

Continuous voltage application

96/192/408
48/96/192
24/48/96

AECQ100-Rev-E
AECQ101

Automotive-grade semiconductor discrete device stress test certification

110±2
130±2

85±S
85±S

Continuous voltage application/
No bias

264/96

JESD22-A101C

Steady-state temperature, humidity/bias, life test (temperature bias life)

85±2

85±S

Continuous/intermittent application
Voltage

24/168/1000

JESD22-A102E

High-pressure steam test (accelerated moisture resistance penetration)

121±2

100±S

No bias

24/48/96/168/240/336

JESD22-A110E

HAST high-accelerated temperature stress test

110±2
130±2

85±S
85±S

Continuous/intermittent application
Voltage

264/96

JESD22-A1188

Temperature without bias voltage high-accelerated stress test UHAST (unbiased voltage unsaturated high-pressure steam)

110±2
130±2

85±S
85±S

No bias

264/96

 

*Customizable specifications and non-standard models

HAST High-Pressure Accelerated Aging Test Chamber (Automatic Door)

Model

KS-2HAST-31L-A/B

KS-2HAST-69L-A/B

KS-2HAST-154L-A/B

KS-2HAST-248L-A/B

Volume (L)

31 L

69 L

154 L

248 L

Internal Dimensions
(mm)

Diameter φ

350

400

550

650

Depth D

450

550

650

750

External Dimensions
(mm)

Width W

700

700

850

950

Depth D

1000

1000

1150

1350

Height H

1710

1710

1760

1860

Performance Indicators

Temperature Range

A: +100~+143℃;
B: +100~+156℃

Humidity Range

60%~100%RH

Pressure Range

A: 0.2~3kg/cm² (0.018~0.294Mpa);
B: 0.2~4kg/cm² (0.018~0.394Mpa)

Temperature Uniformity

≤±2℃

Temperature fluctuation

≤±0.5℃

Humidity fluctuation

≤±2 % R.H

Humidity deviation

≤±3 % R.H

Temperature deviation

≤±2℃

Pressure deviation

≤±2Kpa

Heating-up time

Room temperature~+ 143℃ approximately 45 min;Room temperature~+ 156℃ approximately 55 min

Pressurization time

Normal pressure~3kg/cm² approximately 35 min, external gas source pressurization: approximately 5 min

Power

2.8KW

3.2KW

4KW

5KW

Cabinet material

Inner box

SUS #316 stainless steel

Outer box

Cold-rolled steel plate + double-sided electrostatic spraying process

Insulation

Ultra-fine glass wool

Noise

≤60(dB)

Controller

7-inch color touch screen controller (with pressure, temperature and humidity, with RS-485 or RS-232 communication, USB data baking)

Resolution

Temperature: 0.01℃;Humidity: 0.1%RH;Pressure: 0.1 kg/cm²;

Pressurization method

1. Boiler steam pressurization;2. External gas pressurization

BIAS bias terminal

Including bias terminal (please specify when ordering optional)

Operating conditions

Ambient temperature: +5℃~+35℃; Ambient humidity: ≤85%RH;Ambient atmospheric pressure requirement: 86KPa~106KPa

Power supply

AC220V 50/60Hz

Protection device

1. Overtemperature protection, 2. Fan overload protection, 3. Chamber door pressure protection, 4. Water shortage protection, 5. Overflow protection, 6. Heater dry burning protection,
7. Heater overload protection, 8. Power phase failure protection, 9. Overcurrent protection, 10. Short circuit and leakage protection

Model description